Customer Needs & Application Scenarios
Parts Optimization - Part CIP
- Introduction of Original vs. Aftermarket Parts
- Performance Comparison of Old vs. New Products
- Key Quality Differences Between OK and NG Products
- Compatibility of Parts with Machines/Processes
- Enhanced Product Quality Assurance
- Strengthened Incoming Material Inspection
Customized Measurement Requirements
- Non-destructive/Non-contact Measurement Methods
- Multi-point or Full-area/Surface Scanning Detection
- Special Workpiece Specifications
- Correlation Analysis Needs
- N+1 Quality Key Factors
About MetroCanS
Founded in 2020, MetroCanS focuses on developing critical semiconductor component inspection technologies for semiconductor industry clients and industrializing their applications. The company aims to become an expert in resolving issues related to component production and production line quality anomaly analysis.
Since 2021, through independent research and development, we have begun developing customized measurement equipment and have partnered with system integration partners to launch several advanced measurement technologies and devices. These include optical surface profile measurement, surface contamination and composition analysis measurement, environmental and equipment particle monitoring systems, and HDP nozzle flow rate detection equipment. Our products not only hold several Taiwanese patents but have also obtained SEMI S2 certification.